We have made sets of skirts in a straight and a flared pattern in five different fabrics which vary in fiber content, weave structure and weight. We then scan each garment on a dress form and also photograph it.
In the future, Steve Marschner from Cornell's Computer Science Department and his group will use the scan data and digital versions of the patterns to analyze the mathematics of fabric drape.
|
|
|
|
|
|
|
|
|
|
|